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| Three-dimensional information measurement of wheat grain based on image technology |
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| DOI： |
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| Hits: 2014 |
| Download times: 1094 |
| Abstract: |
| In order to get the three-dimensional information of wheat grains rapidly，a method based on image analysis technology was designed to calculate the length，width and thickness of wheat grains. Minimal outer rectangle of grain was used to calculate the grain's length and width. The striplight at specific angles was used to generate shadows of wheat grains，and those shadows could describe the thickness of grains one-to-one. We measured the 256 grains of 4 varieties with image analysis technology and vernier caliper. Then we compared the results and got a high correlation coefficient（ R2>0.9），respectively. The root mean square error of the length was 0.0988，and the width and thickness were 0.08413 and 0.0917. All the results demonstrated that the three-dimensional information of wheat grains could be obtained by a two-dimensional picture depending on the light source，and the method discussed in this paper is promising and encouraging to obtain the three-dimensional information of wheat grains. |
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