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| Lodging Resistance and Genetic Analysis of the High-yield and High-quality Rice Variety Yuehesimiao |
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| DOI：10.16768/j.issn.1004-874X.2023.12.014 |
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| Abstract: |
| 【Objective】By measuring and analyzing the physical characteristics of the basal stems of rice, the relationship between these traits and the stem breaking resistance was explored, and the core traits affecting the basal stem breaking resistance of rice were identified, providing a theoretical basis for the breeding of rice lodging-resistant varieties. 【Method】The study analyzed the lodging resistance-related agronomic traits, including plant height, single plant bending resistance, basal internode breaking resistance, and stem structure, of the rice variety Yuehesimiao, the lodging-susceptible variety Xiangyaxiangzhan, and Yuehesimiao × Xiangyaxiangzhan F2 segregation populations. The influence of each trait on lodging resistance of rice was evaluated by correlation coefficient. 【Result】There are significant differences in lodging resistance between the two varieties of Yuehesimiao and Xiangyaxiangzhan. The N2 (second internode from the base) breaking resistance (16.58 N), N2 wall thickness (1.02 mm), N2 filling degree (0.19 g/cm), and N2 stem diameter (6.21 mm) of Yuehesimiao are significantly larger than those of Xiangyaxiangzhan (N2 breaking resistance: 9.93 N, N2 wall thickness: 0.66 mm, N2 filling degree: 0.11 g/cm, N2 stem diameter: 4.60 mm). The N2 breaking resistance, N2 length, N2 stem diameter, stem wall thickness, fresh weight and filling degree of the F2 population show continuous distribution and are controlled by polygenes. The correlation analysis results of the F2 population show that, N2 breaking resistance is positively correlated with plant height (r=0.18), N2 breaking resistance is significantly positively correlated with N2 wall thickness (r=0.75**). N2 breaking resistance is significantly positively correlated with N2 filling degree (r=0.67*). N2 breaking resistance is positively correlated with N2 minor axis (r=0.52) and N2 stem diameter is negatively correlated with N2 length (r=-0.20).【Conclusion】The genetic mechanism of lodging resistance in the F2 population of Yuehesimiao × Xiangyaxiangzhan shows that N2 wall thickness is significantly positively correlated with N2 breaking resistance and is the core trait of stem lodging resistance, which is a quantitative trait controlled by polygenes. Taking N2 wall thickness as the research focus will greatly reduce the complexity of previous research methods for lodging resistance, which clarifies the research goals and directions for future lodging resistance-related researches. |
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